Testing

 

Surface and Thin Film Measurement

• Tencor Stylus profilometer
• Talysurf white light interferometer (1nm resolution in z axis)
• Nanometrics thickness measurement
• Keyence 4K High Definition Digital Microscope (6000x)

 

Electrical characterisation:

• CV
• IV
• Wentworth probe station and cold station.(-200C to 250C).