With the arrival of new microscopes, it can be important to understand the capabilities. Here, we will present the recently installed JEOL JSM-IT200 and JEOL JXA-iHP200F at the Ewald Microscopy Facility. The JSM-IT200 is a straightforward SEM with a tungsten electron source, equipped with low vacuum, elemental analysis and two imaging detectors which can pick up six different signals. The JXA-iHP200F is a Field Emission Electron Probe MicroAnalyser (EPMA) with four wavelength dispersive spectrometers, EDS and imaging capabilities including cathodoluminescence detection.

Some topics we will cover will be: the difference between SEM and EPMA, and what imaging and analysis you can expect from them. What imaging detectors are available and more importantly, how to investigate with them. How to improve your images and optimise your analysis, by considering your sample, interaction volumes and more. Also included will be solutions for difficult samples.
For those that wish to know more, we will circulate our SEM and EPMA Webinar series for further information.

Refreshments will be provided.