Facilities
EMC instruments include two dual beam focused ion beam (FIB) microscopes, a scanning electron microscope (SEM), several atomic force microscopes (AFMs) and a transmission electron microscope, as well as a range of instrumentation for sample preparation and data analysis.
Click on the links below for more information:
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Two TESCAN LYRA3 Dual beam focused ion beam scanning electron microscopes LYRA3 is a dual beam system that combines a high-resolution FE-SEM column with a versatile high-performance Ga ion source FIB |
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Atomic Force Microscope (AFM): MFP-3D infinity More Information |
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JEOL JXA-iHP200F Probe Microanalyser |
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TALOS F200X G2: Scanning/ transmission electron microscope (S/TEM) |
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X-ray diffraction (XRD) |
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Ewald Microscopy Facility
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