Atomic Force Microscope (AFM)
Atomic Force Microscope (AFM): MFP-3D infinity
Features:
- Capable of atomic resolution imaging of calcite in water and high-resolution topography mapping of large areas
- Fully equipped electrical characterisation modes: KPFM, EFM, Conductive AFM, PFM, SSRM etc.
- In-plane variable Magnetic field (-0.8 to 0.8 T), Compatible with other imaging modes
- Sample heater for variable temperature imaging (25-400°C)
- Scanning Thermal Microscopy (up to 160°C)
- Lithography, Magnetic force microscopy with unprecedented resolutions
- High Voltage option up to +/- 150V
Applications:
- Most advanced surface topography mapping with excellent resolution
- Wide range of simultaneous functional imaging modes for samples
- Nanoscale electrical and magnetic characterisation with variable fields (especially relevant for memory applications)
- Investigating glass transitions and softening in polymers
- Nanoscale mechanical characterization (force mapping) for evaluating modulus and adhesion
- Nanoscale characterization of energy related materials (fuel cells and batteries) and 2D materials
- Lithography, nanomanipulation and nanoindentation
- High resolution conduction mapping
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