JEOL JXA-iHP200F Probe Microanalyser

Field-Emission Probe Microanalyser (EPMA) with EDS and WDS spectrometers allowing multiple samples to be examined. Additional, sample coating can be by gold or carbon depositions.

Features:

• Electron Beam Acceleration voltage up to 30kV
• Working distance 10 mm
• Secondary and backscattered (topography and composition) electron detectors
• Cathodoluminescence detector
• Easy navigation system

Applications:

• Surface and morphology examination by SEM
• Chemical analysis by EDS and WDS