TALOS F200X G2: Scanning/ transmission electron microscope (S/TEM)

FEI Talos combines high-resolution S/TEM and TEM imaging with energy dispersive x-ray spectroscopy (EDX) for chemical characterization with composition mapping.

Features:

• EDX system for chemical analysis: ≤136 eV for Mn-K_α
• Fast detector camera: 4k × 4k movies at 1 fps or 512 × 512 movies at 25fps.
• TEM information limit: ~0.12 nm
• STEM resolution: ~0.16 nm
• 80 and 200 kV settings (for beam sensitive samples)
• Single tilt Heating/biasing holder (up to 1000°C)

Applications:

• Chemical analysis and elemental distribution: alloys, catalyst, ceramics, etc.
• Structural analysis: grain structure, crystallographic information, metrology, failure analysis, etc.